A) the frequency of characteristic X-rays of a material will get changed
B) Number of electron reaching the anode will change
C) number of characteristics X-ray lines must decrease
D) the difference between\[{{\lambda }_{0}}\] (minimum wavelength) and \[{{\lambda }_{K\alpha }}\] (wavelength of \[{{K}_{\alpha }}\]X-ray) will get changed.
Correct Answer: D
Solution :
\[\frac{1}{{{\lambda }_{K\alpha }}}=R{{Z}^{2}}\left( \frac{1}{{{1}^{2}}}-\frac{1}{{{2}^{2}}} \right)=\frac{3}{4}R{{Z}^{2}};\frac{1}{{{\lambda }_{0}}}=\frac{e{{V}_{A}}}{hc}\] As P.D. increases minimum wavelength decreases.
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